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US Patent Issued to Regeneron Pharmaceuticals on Sept. 8 for "Devices and methods for a retainer adapter assembly" (New York Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,945, issued on Sept. 8, was assigned to Regeneron Pharmaceuticals Inc. (Tarrytown, N.Y.). "Devices and methods for a retainer adapter assem... Read More


US Patent Issued to AGR INTERNATIONAL on Sept. 8 for "Multi-mode thickness measurement device and methods" (Pennsylvania Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,946, issued on Sept. 8, was assigned to AGR INTERNATIONAL INC. (Butler, Pa.). "Multi-mode thickness measurement device and methods" was inv... Read More


US Patent Issued to CHINA THREE GORGES on Sept. 8 for "Built-in gap measuring device and gap measurement method" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,947, issued on Sept. 8, was assigned to CHINA THREE GORGES Corp. (China). "Built-in gap measuring device and gap measurement method" was in... Read More


US Patent Issued to ASML Netherlands on Sept. 8 for "Method to determine an absolute position of a movable object, interferometer system, projection system and lithograpic apparatus" (Dutch Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,948, issued on Sept. 8, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Method to determine an absolute position of a mova... Read More


US Patent Issued to TOKYO SEIMITSU on Sept. 8 for "Three-dimensional shape measuring device, reference surface position adjustment method therefor, and measurement mode switching method therefor" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,949, issued on Sept. 8, was assigned to TOKYO SEIMITSU Co. LTD. (Tokyo). "Three-dimensional shape measuring device, reference surface posit... Read More


US Patent Issued to HOCHSCHULE TRIER on Sept. 8 for "Double-mirror shear interferometer" (German Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,950, issued on Sept. 8, was assigned to HOCHSCHULE TRIER (Trier, Germany). "Double-mirror shear interferometer" was invented by Christopher... Read More


US Patent Issued to HAMAMATSU PHOTONICS on Sept. 8 for "Thickness-distribution measurement device and thickness-distribution measurement method" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,951, issued on Sept. 8, was assigned to HAMAMATSU PHOTONICS K.K. (Hamamatsu, Japan). "Thickness-distribution measurement device and thickne... Read More


US Patent Issued to United States Pipe and Foundry on Sept. 8 for "Measurement method and apparatus" (Alabama Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,952, issued on Sept. 8, was assigned to United States Pipe and Foundry Co. LLC (Birmingham, Ala.). "Measurement method and apparatus" was i... Read More


US Patent Issued to NEC on Sept. 8 for "Information processing system, information processing method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,953, issued on Sept. 8, was assigned to NEC Corp. (Tokyo). "Information processing system, information processing method, and recording med... Read More


US Patent Issued to ArcelorMittal on Sept. 8 for "Leveller calibration device" (French Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,729,954, issued on Sept. 8, was assigned to ArcelorMittal (Luxembourg). "Leveller calibration device" was invented by Mounir Amourak (Metz, Fra... Read More